Contour measurement using time based triangulation methods

G - Physics – 01 – B

Patent

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343/7

G01B 11/24 (2006.01)

Patent

CA 1336786

Disclosed is an improvement in a non-contact surface contour measurement system having radiation emitting and guiding devices to produce a scanning beam of radiation, radiation receivers to receive a reflection of the scanning beam from the surface of an object to be measured and to focus the reflection upon a signal producing radiation sensitive detector array, and a signal processor and data processor to convert scanning beam positional data from the radiation emitting and guiding devices and from the detector array to contour plotting data points. The improvement comprises a radiation channeling surface acting as the front stage of the radiation sensitive detector array; and one or more signal producing radiation receivers acting as the rear stage of the radiation sensitive detector array; wherein the channeling surface comprises a substantially linear array of the radiation receiving ends of a plurality of radiation feeders, each for conducting the reflected radiation to a radiation receiver, and wherein each of the radiation receivers is coupled by a set of radiation feeders to the radiation channeling surface to comprise a single receiving channel in such a way that successively numbered receivers and their associated channels are connected to succes- sively positioned feeders in their linear array on the channeling surface in sequential alternation.

615022

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