Control embedded machine condition monitor

Details Control embedded machine condition monitor Control embedded machine condition monitor

G - Physics

06

F

G06F 19/00 (2006.01) G01H 1/00 (2006.01) G01N 37/00 (2006.01) G07C 3/00 (2006.01)

Patent

CA 2428168

Analog signals generated (103) in response to operating parameters of a machine (100) are converted into rms signals that are periodically sampled (108, 109), sorted into defined rms value bands and saved as an evolving history of the operation of the machine (100).

Des signaux analogiques produits en réponse à des paramètres de fonctionnement d'une machine sont convertis en signaux de moyenne quadratique qui sont échantillonnés périodiquement, triés en bandes de valeur moyenne quadratique et sauvegardés comme historique évolutif du fonctionnement de la machine.

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