C - Chemistry – Metallurgy – 30 – B
Patent
C - Chemistry, Metallurgy
30
B
148/1.5
C30B 15/00 (2006.01)
Patent
CA 1067800
CONTROL OF OXYGEN IN SILICON CRYSTALS Abstract of the Disclosure The seed to tail oxygen concentration gradient in silicon crys- tals, which are drawn from a silicon melt contained in a silica ves- sel according to the Czochralski process, is controlled by a process employing stop-go crucible rotation to provide fluid shearing at the melt-crucible interface.
263823
Patrick William J.
Westdorp Wolfgang A.
LandOfFree
Control of oxygen in silicon crystals does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Control of oxygen in silicon crystals, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Control of oxygen in silicon crystals will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-502898