Control of the positional relationship between a sample...

B - Operations – Transporting – 01 – L

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B01L 3/00 (2006.01)

Patent

CA 2729699

A system (20) and method utilizes an image analysis approach for controlling the collection instrument-to--surface distance in a sampling system for use, for example, with mass spectrometric detection. Such an approach involves the capturing of an image of the collection instrument (23) or the shadow thereof cast across the surface (22) and the utilization of line average brightness (LAB) techniques to determine the actual distance between the collection instrument and the surface. The actual distance is subsequently compared to a target distance for re-optimization, as necessary, of the collection instrument-to-surface during an automated surface sampling operation.

Linvention concerne un système (20) et un procédé faisant appel à une approche par analyse dimages pour contrôler la distance dun instrument de prélèvement à une surface dans un système de prélèvement destiné à être utilisé, par exemple, avec une détection par spectrométrie de masse. Une telle approche fait intervenir la capture dune image de linstrument (23) de prélèvement ou de lombre de celui-ci portée sur la surface (22) et lutilisation de techniques de luminosité moyenne par lignes (line average brightness (LAB) pour déterminer la distance effective entre linstrument de prélèvement et la surface. La distance effective est ensuite comparée à une distance visée en vue de ré-optimiser, en tant que de besoin, la distance de linstrument de prélèvement à la surface pendant une opération automatisée de prélèvement en surface.

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