Controlled atomic force microscope

G - Physics – 01 – Q

Patent

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G01Q 10/00 (2010.01)

Patent

CA 2653116

The invention relates to an atomic force microscope comprising a microtip (1) placed on a flexible support connected to a microscope head (11) facing a surface (5) to be studied, which includes means (31, 32) for controlling the distance between said head and said surface for a given value and means (31, 35) for inhibiting vibration of the microtip.

L'invention concerne un microscope à force atomique comprenant une micropointe (1) disposée sur un support souple lié à une tête de microscope (11) en regard d'une surface à étudier (5), comprenant des moyens (31, 32) pour asservir à une valeur donnée la distance entre ladite tête et ladite surface, et des moyens (31, 35) pour inhiber la vibration de la micropointe.

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