Coordinate measuring machine inspection and adjustment method

Details Coordinate measuring machine inspection and adjustment method Coordinate measuring machine inspection and adjustment method

G - Physics

01

C

33/133, 354/25

G01C 25/00 (2006.01) G01B 21/04 (2006.01)

Patent

CA 1187179

A coordinate measuring machine (CMM) inspection and adjustment method includes installing an artifact on the CMM table. The CMM probe is coupled to the artifact and moved to a plurality of positions defined by the artifact so that the CMM generates a plurality of Cartesian coordinate data points. A set of distance equations are generated in terms of the data points, a known dimension of the artifact and unknown CMM axis alignment and scale error factors. The set of equations is solved for the error factors, which are then converted to numbers which represent the magnitude of the needed CMM adjustments. The CMM can then be adjusted to a properly aligned condition according to these numbers.

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