Cost-function directed search method for generating test for...

Details Cost-function directed search method for generating test for... Cost-function directed search method for generating test for...

G - Physics

01

R

354/1, 356/117,

G01R 31/28 (2006.01) G01R 31/3183 (2006.01)

Patent

CA 1315016

- 17 - A COST-FUNCTION DIRECTED SEARCH METHOD FOR GENERATING TESTS FOR SEQUENTIAL LOGIC CIRCUITS Abstract A method for developing a test sequence and for testing manufactured digital circuits. Test vectors are developed based on a simulation-based, directed- search approach. Specifically, front a given test vector, a next test vector is developed by altering the given test vector and determining the utility of the altered trial vector in propagating circuit fits to the primary outputs, based on a simulation of the circuit and a preselected cost function. The vector set is created through an iterative process of altering an accepted test vector to develop a next trial vector. The vector set is efficiently developed by employing one phase that treats the entire set of circuit faults as the target, followed by another phase that targets specific faults that have not been detected in the previous phase.

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