C - Chemistry – Metallurgy – 07 – J
Patent
C - Chemistry, Metallurgy
07
J
C07J 1/00 (2006.01)
Patent
CA 2691772
New crystalline polymorph of exemestane characterized by a powder X-ray diffraction pattern having peaks at 10.7~0.1, 15.9~0.1, and 18.1 ~0.1 2- theta degree.
L'invention concerne un nouveau polymorphe cristallin d'exémestane caractérisé par un diagramme de diffraction de rayons X sur poudres comportant des crêtes à 10,7±0,1, 15,9±0,1 et 18,1±0,1 2-thêta degré.
Chen Shu-Ping
Chen Weiyu
Wang Sinchi
Moffat & Co.
Scinopharm Taiwan Ltd.
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