C - Chemistry – Metallurgy – 01 – B
Patent
C - Chemistry, Metallurgy
01
B
23/192, 252/34
C01B 33/12 (2006.01) C01B 37/02 (2006.01)
Patent
CA 1153868
ABSTRACT OF THE DISCLOSURE: The present invention is concerned with a crystal- line SiO2-modification, which is characterized by an X-ray diffraction diagram having certain diffraction lines, and with a process for the preparation of this crystalline SiO2-modifi- cation. This process is achieved by heating a mixture of a reactive amorphous SiO2 in an aqueous solution of hexamethylene- diamine at a temperature of from 100° to 200°C for from 0.5 to 50 days, to effect crystallization of the SiO2 to the crystal- line SiO2-modification. Sodium ions, phosphate ions and /or sulfate ions may be added for the crystallization. With the novel process it is possible to prepare new , high-grade absorbents which have a definite pore size and are therefore particularly suitable for the selective separation of organic components from solvents.
346042
Marosi Laszlo
Schwarzmann Matthias
Stabenow Joachim
Basf Aktiengesellschaft
Robic Robic & Associes/associates
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