Crystallization device for high-throughput visual inspection...

G - Physics – 01 – N

Patent

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Details

G01N 1/28 (2006.01) C30B 35/00 (2006.01) C40B 40/10 (2006.01) C40B 60/00 (2006.01) G01N 23/20 (2006.01) G02B 21/34 (2006.01)

Patent

CA 2708596

A crystallization chip has a two-dimensional substrate surface with modified wetting properties convenient for the evaluation of the crystallization experiment results by optical microscope and by X-ray diffraction. A crystallization chip mount comprises a base and a support structure that is connected to the base. The support structure provides a first channel that receives a portion of the crystallization chip. A crystallization chip holder comprises a body defining at least one slot to slidably receive the crystallization chip described herein. The at least one slot extends from an upper surface to a lower surface of the body. The crystallization chip holder further includes at least one support surface for each slot. For a given slot the at least one support surface is disposed on an edge of at least two surfaces of portions of the body that define the given slot. During use, the at least one support surface supports the crystallization chip prior to, during or after the formation of crystals.

La présente invention concerne une puce à cristallisation comportant une surface de substrat bidimensionnelle dont les propriétés mouillantes modifiées conviennent particulièrement pour évaluer les résultats d'expériences de cristallisation en procédant par examen au microscope optique et par diffractométrie de rayons X. Le montage d'une telle puce à cristallisation comprend une base et une structure support reliée à la base. Cette structure support présente un premier canal qui reçoit une partie de la puce de cristallisation. L'invention comporte un porte-puce de cristallisation comprenant un corps définissant au moins une fente permettant de recevoir coulissant le puce de cristallisation de l'invention. Cette fente va d'une face supérieure à une face inférieure du corps. Le porte-puce de cristallisation comprend également au moins une surface support pour chaque fente. Pour une fente donnée, la surface support considérée est disposée sur un bord d'au moins deux surfaces de parties du corps définissant la fente considérée. En cours d'utilisation, les surfaces support considérées supportent la puce à cristallisation avant, pendant ou après la formation des cristaux.

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