Cu-ni-si-co copper alloy for electronic materials and method...

C - Chemistry – Metallurgy – 22 – C

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C22C 9/06 (2006.01) B21B 3/00 (2006.01) C22F 1/08 (2006.01) H01B 1/02 (2006.01) H01B 13/00 (2006.01) H01L 23/50 (2006.01) C22F 1/00 (2006.01)

Patent

CA 2669122

This invention provides a Cu-Ni-Si-Co-base alloy possessing excellent strength, electroconductivity and press punchability. The Cu-Ni-Si-Co-base alloy is a copper alloy for an electronic material and comprises Ni: 1.0 to 2.5% by mass, Co: 0.5 to 2.5% by mass, and Si: 0.30 to 1.2% by mass with the balance consisting of Cu and unavoidable impurities. The observation of a cross section parallel to the rolling direction of the copper alloy, for a variation in composition and the area ratio of second phase particles having a diameter of not less than 0.1 µm and not more than 1 µm, shows that the middle value .rho. (% by mass) of the amount of [Ni + Co + Si] is 20 (% by mass) <= .rho. <= 60 (% by mass), the standard deviation .sigma.(Ni + Co + Si) is .sigma.(Ni + Co + Si) <= 30 (% by mass), and the area ratio S (%) is 1% <= S <= 10%.

L'invention concerne un alliage à base de Cu-Ni-Si-Co possédant d'excellentes aptitudes en termes de résistance, d'électroconductivité et de perforage. Cet alliage à base de Cu-Ni-Si-Co est un alliage de cuivre pour matériau électronique et il contient entre 1,0 et 2,5% en masse de Ni, entre 0,5 et 2,5% en masse de Co et entre 0,30 et 1,2% en masse de Si, le reliquat se composant de Cu et d'impuretés inévitables. L'observation d'une section transversale parallèle à la direction de laminage de l'alliage de cuivre lors d'un changement de la composition et du rapport de surface des particules de seconde phase ayant un diamètre compris entre 0,1 µm au minimum et 1 µm au maximum, montre que la valeur moyenne .rho. (% en masse) de la quantité de [Ni + Co + Si] répond à 20 (% en masse) <= .rho. <= 60 (% en masse), la déviation standard .sigma.(Ni + Co + Si) répond à .sigma.(Ni + Co + Si) <= 30 (% en masse), et le rapport de surface S (%) répond à 1% <= S <= 10%.

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