G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 27/02 (2006.01) A61B 5/053 (2006.01) G01N 27/02 (2006.01) G01R 33/20 (2006.01)
Patent
CA 2480430
A method for non-invasive mapping (imaging) of the electrical impedance of an object. The present invention provides a method, current density impedance imaging (CDII) which produces an impedance image of object by measuring current density distributions and directly calculating the local impedance values. The method includes making measurements of at least two current density vector fields, J1 and J2, within a region of interest in an object and then calculating the logarithmic gradient of local conductivity, ~ In .delta.(x, y, z) , using a formula (see formula I) where ~1 (x, y, z) and ~2 (x, y, z) , are the pair of measured nonparallel current densities at point (x,y,z) and ~ denotes the gradient operator.
Hasanov Karshi F.
Joy Michael L. G.
Nachman Adrian
Yoon Richard S.
Hasanov Karshi F.
Hill & Schumacher
Joy Michael L. G.
Nachman Adrian
Yoon Richard S.
LandOfFree
Current density impedance imaging (cdii) does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Current density impedance imaging (cdii), we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Current density impedance imaging (cdii) will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1930783