D.c. testable ttl logic circuit

Details D.c. testable ttl logic circuit D.c. testable ttl logic circuit

H - Electricity

03

K

328/127

H03K 19/08 (2006.01) H03K 19/088 (2006.01) H03K 19/12 (2006.01)

Patent

CA 1089032

TRANSISTOR-TRANSISTOR-LOGIC CIRCUIT Abstract of the Disclosure Disclosed is a transistor-transistor-logic (TTL) circuit which is testable by D.C. Testing Techniques. The improvement includes a high impedance network for providing sufficient base drive to drive the output transistor into conduction when the malfunctioning input transistor fails to provide a turn-off logic level. The high impedance network can be a Schottky barrier diode and an epitaxial resistor connected in a series path between a potential supply and the base region of the output transistor.

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