Data acquisition system for the computer control of aluminum...

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G01R 19/00 (2006.01) C25C 3/20 (2006.01) G01R 15/00 (2006.01)

Patent

CA 1219636

ABSTRACT Disclosed is a system for measuring cell potentials in an aluminum potline having a plurality of cells connected in series. The system enables better control of the cells than the current method which calculates cell resistance on the basis of measured cell potentials and potline current but an assumed value of back e.m.f. The present invention uses corrected voltage measurements and provides a decentralized, current independent cell potential measuring system which converts simultaneously all cell potentials during a nominal integration period (e.g. 1 second) into a value corresponding to the potline current when it is at its normal (set-point) value. Simultaneously, various possible back e.m.f. values are measured with the same current relationship and compu- tations made of the error caused by the non-ohmic portion of the cell potential when the current deviates from its normal (set- point) value. Sudden changes in current enable correct values of back e.m.f. to be determined.

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