Data quality tracking by determining metric values for child...

Details Data quality tracking by determining metric values for child... Data quality tracking by determining metric values for child...

G - Physics

06

F

G06F 17/00 (2006.01)

Patent

CA 2728132

In general, a method includes determining (502) metric values associated with data quality for one or more child nodes. Metric values are determined (504) for a parent node based on the metric values of at least some of the child nodes, and relationships between one or more parent nodes and one or more child nodes define a hierarchy. The determination of the metric value for the parent node is repeated (506) for multiple instances. Image

L'invention concerne en général un procédé qui comprend la détermination (502) de valeurs métriques associées à la qualité de données pour un ou plusieurs nuds enfants. Les valeurs métriques sont déterminées (504) pour un nud parent sur la base des valeurs métriques d'au moins une partie des nuds enfants, et des relations entre un ou plusieurs nuds parents et un ou plusieurs nuds enfants définissent une hiérarchie. La détermination de la valeur métrique pour le nud parent est répétée (506) pour de multiples instances.

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