Data recovery and clock circuit for use in data test equipment

Details Data recovery and clock circuit for use in data test equipment Data recovery and clock circuit for use in data test equipment

H - Electricity

04

L

340/73

H04L 7/00 (2006.01) H03K 5/05 (2006.01) H04L 7/033 (2006.01)

Patent

CA 1264830

A DATA RECOVERY AND CLOCK CIRCUIT FOR USE IN DATA TEST EQUIPMENT Abstract of the Disclosure A digital data and clock recovery circuit for use in a digital test head has a digital input port and a digital output port. A clock having a frequency several times the nominal bit rate of the input data drives several series-connected flip flops to generate a corresponding output pulse stream in which the pulses are of fixed pulse duration. Outputs are also taken from the flip flop array to generate a strobe pulse having a predetermined phase relationship to the output data pulses. The flip flop array operates on positive going pulses derived from a bipolar data input stream. An identical array is used to similarly condition negative going input data pulses, outputs from the arrays being combined to synchronize the strobe signal. - i -

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