Data transmission system with test loop facilities

Details Data transmission system with test loop facilities Data transmission system with test loop facilities

H - Electricity

04

L

340/71

H04L 5/14 (2006.01) H04B 17/02 (2006.01) H04L 1/24 (2006.01)

Patent

CA 1131729

Abstract When testing a data transmission system comprising two trans- mission devices it is feasible that the test loops of both transmission devices are closed so that a latched (locked-in) state is created, wherein the loop signal continuously circulates from one transmission device to the other thus preventing a return to the normal state of data transmission via the two lines. It is the object of the present invention to test the data trans- mission system without incurring a latched state. According to the present invention at least one bit of the loop signal - adapted to be transmitted to the first transmission device via the second transmission device - is changed before it is re-transmitted to the second transmission device. Use in data transmission systems adapted to operate in outgoing and incoming direction, in particular in the transmission of envelopes.

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