G - Physics – 01 – B
Patent
G - Physics
01
B
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G01B 11/06 (2006.01) G01J 9/02 (2006.01) G06K 7/14 (2006.01) G11B 7/00 (2006.01) G11B 7/005 (2006.01) G11B 7/24 (2006.01)
Patent
CA 1270679
ABSTRACT The optical path difference between two reflec- ting surfaces of an etalon 2 is monitored by directing a light beam B onto the etalon, directing the reflected beam Ba from the etalon onto an optical reference wedge 3 and directing the reflected beam Bb from the wedge onto a linear photo-detector array 4. The position along the array 4 of a peak of light intensity represent the loca- tion of an interference maximum and corresponds to reflec- tion of light at that position along the length L of the wedge 3 at which the optical path difference of the wedge equals the optical path difference of the etalon being measured. The etalon 2 may comprise a data carrier encod- ed by variations in its relief (and therefore in its optical path difference), which data carrier may comprise a rotatable disc and the apparatus may comprise an optical head movable radially of the disc to read different concen- tric tracks.
522249
Hatfield James H.
Imperial Chemical Industries Plc
Marks & Clerk
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