Defect inspection system

Details Defect inspection system Defect inspection system

H - Electricity

04

N

350/32

H04N 7/18 (2006.01) G01N 21/88 (2006.01)

Patent

CA 1126855

ABSTRACT OF THE DISCLOSURE A defect inspection system which inspects the defects on an object to be inspected by photosensing the inspected object with a monochrome television camera. A pair of detection circuits are provided which receive such image signal corresponding to the inspected object from the television camera and have different sensitivities so that both or only one of the pair outputs a signal in accordance with the rate of change of the image signal level with respect to time. Both of the outputs from the pair of detection circuits are supplied to a mixer circuit. In this case, the mixer circuit is so formed that it will only output a defect detection signal when only one of the above mentioned pair of detection cir- cuits shall output a signal.

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