Defect leakage screen system

Details Defect leakage screen system Defect leakage screen system

G - Physics

11

C

324/58.1

G11C 29/00 (2006.01) G11C 29/50 (2006.01)

Patent

CA 1242246

Abstract Defect Leakage Screen System A test circuit or system is provided wherein data is stored in circuits or cells of an array or matrix with the use of conventional or normal operating voltages. Voltages at internal nodes of the circuits or cells are altered to magnitudes beyond the normal operating ranges, which includes significantly decreasing the offset voltage, for a short period of time and then the stored data is read out at normal-voltages and currents and compared with the data written into the circuits or cells.

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