G - Physics – 01 – D
Patent
G - Physics
01
D
234/5, 252/55
G01D 5/39 (2006.01) G01D 15/06 (2006.01) G01D 15/24 (2006.01) G11B 3/70 (2006.01)
Patent
CA 1081669
DEFECT PLOTTING SYSTEM Abstract of the Disclosure High speed writing apparatus, for mapping 1:1 polar plots of disc record defect locations on disc-shaped electrosensitive paper, accepts electrical signals representing defect occurrences from a defect detector which scans the disc record surface in a spiral scanning pattern. These signals activate a high voltage switch circuit that produces an electric current between an electric writing pen stylus and a conducting surface of a turntable of the printing apparatus upon which the disc shaped electrosensitive paper is mounted. Relative motion is established between the turntable and the writing pen in a manner causing markings resulting from pen activations to be located on the electrosensitive paper with radial and circumferential positions corresponding to the locations of the defects appearing on the disc record, thereby generating 1:1 polar plots of the defect locations on the paper. The writing pen scans the paper disc surface in a spiral scanning pattern in synchronization with the defect detector scanning of the disc record. The writing pen is a multistylus pen used in a balanced configuration to effect high speed marking of defect locations without causing damage to the paper. -1-
279016
Firester Arthur H.
Walentine Joseph P.
Morneau Roland L.
Rca Corporation
LandOfFree
Defect plotting system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Defect plotting system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect plotting system will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-813936