G - Physics
01
N
73/53
G01N 21/01 (2006.01) G01N 21/59 (2006.01) G01N 30/95 (2006.01)
Patent
CA 1057972
r ABSTRACT OF THE DISCLOSURE Densitometer for measuring a sample spot developed on a thin layer chromatography plate or the like, wherein two dual-wavelength zigzag scanning is conducted on the spot, and compensation based on Kubelka-Munk's theoretical equations is made on the measured output so that the output is substantially proportional to the quantity of the substance in the spot being scanned. - 1 -
231927
Hira Rikuo
Kurita Takashi
Makabe Hideki
Suzuki Jugoro
Yamamoto Hiroshi
LandOfFree
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