Detection and correction of defects from scanner calibration...

H - Electricity – 04 – N

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H04N 1/00 (2006.01) G01N 21/86 (2006.01) G01N 37/00 (2006.01) H04N 1/401 (2006.01) H04N 1/407 (2006.01)

Patent

CA 2374761

Computation of digital gains and offsets used in digital scanners for shading correction (linearity correction) is particularly vulnerable to imperfections in the reference strips, particularly the light reference strip. It is extremely difficult and expensive to create references (133, 203) which are completely free of imperfections or contaminated in some way. This invention eliminates artifacts caused by the presence of small imperfections on the references. It does so by detecting the presence of an artifact (133, 134) and then excluding data contributed by the artifact from the calibration computation process.

Le calcul des gains et des décalages numériques utilisés dans les scanners numériques pour la correction de l'ombrage (correction de linéarité) est particulièrement vulnérable face aux imperfections des bandes de référence, en particulier de la bande de référence de lumière. Il est extrêmement difficile et fort coûteux de créer des références (133, 203) qui soient complètement exemptes d'imperfections ou qui ne soient pas d'une manière ou d'une autre entachées d'impuretés. Cette invention élimine les artéfacts causés par la présence de petites imperfections sur ces références. Ce résultat est obtenu par la détection de la présence d'artéfacts (133, 134) et par l'exclusion des données dues à l'artéfact du processus de calcul d'étalonnage.

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