G - Physics – 01 – B
Patent
G - Physics
01
B
340/124.5
G01B 9/02 (2006.01) G01B 11/00 (2006.01) G01N 21/88 (2006.01)
Patent
CA 1046605
A B S T R A C T A circuit arrangement for use with a scanned-beam moving-surface blemish detector uses the detection of leading- and trailing-edges of the surface in each scan to provide in the following scan a margin or margins the separation of which provides a measure of the surface width over which detection can take place without the edges being detected as faults. In a modification the margins are extended to the direction of surfac movement by introducing a minimum width, between leading-and trailing-edge margins, which must exist before fault detection is permitted.
227314
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