H - Electricity – 01 – J
Patent
H - Electricity
01
J
358/10
H01J 37/26 (2006.01) H01J 37/244 (2006.01)
Patent
CA 1139457
PHN 9431 18.3.79 ABSTRACT: Detector for an electron microscope. A detection system of an electron microscope comprises a number of detection elements which are ar- ranged on ends of flexible optical conductor bundles which face a specimen. The other ends of the optical conductor bundles are optically coupled to a light passage block which is made of a clear material having a comparatively high refractive index. Each detection element can be separately read by means of a diaphragm system which is arranged between this block and a photomultiplier coupled thereto,
349520
Fetherstonhaugh & Co.
N.v. Philips Gloeilampenfabrieken
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