G - Physics – 01 – B
Patent
G - Physics
01
B
73/53, 88/0.1, 3
G01B 9/02 (2006.01) G01N 21/956 (2006.01) G02B 27/42 (2006.01)
Patent
CA 1064133
ABSTRACT First and second pairs of mirrors are oriented to intercept first and second regions, respectively, of a diffraction pattern and deflect these regions to individ- ual detectors so that simultaneous analysis of the regions of the diffraction pattern can be carried out. The pairs of mirrors can be spaced along the optical axis in a man- ner to provide focused regions of the diffraction pattern at the detectors wherein the diffraction pattern itself is imaged at two spaced focal planes resulting from astig- matic conditions. The physical arrangement not only over- comes problems introduced by astigmatism but also permits practical physical positioning of individual photo-diode arrays such that simultaneous processing of the regions in the diffraction pattern can be carried out.
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