Device fabrication through etching a substrate with plasma...

H - Electricity – 01 – L

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204/96.05, 148/3

H01L 21/306 (2006.01) H01L 21/3065 (2006.01) H01L 21/3213 (2006.01)

Patent

CA 1278768

Abstract This invention relates to a process for fabricating a device, including etching of a substrate with a chlorine- containing plasma. By adjusting the AC field conditions, i.e., by grounding the environment of the substrate being etched, a significant increase in etch selectivity is achieved. By applying a similar AC field adjustment to the reaction chamber surfaces, excellent etch uniformity is achieved in conjunction with excellent selectivity. Fig. 1.

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