G - Physics – 01 – B
Patent
G - Physics
01
B
343/7
G01B 11/06 (2006.01) G01B 11/02 (2006.01) G01S 17/46 (2006.01)
Patent
CA 1137598
ABSTRACT OF THE DISCLOSURE A device is disclosed for contact-free thickness or interval measurement wherein a light source generates a light ray beam which is periodi- cally deflected. A beam divider divides out a light ray beam for reception by first and second light-sensitive detectors which receive light only along a specific optical axis. At least one third light-sensitive detector is pro- vided whose optical axis intersects the light ray beam at a reference plane. Electronic evaluation means are provided for generating from signals of the first, second, and third detectors a control voltage corresponding to a deflection time of the light ray beam and also at least one voltage impulse which is a measure of an interval of a surface of a measured object from the reference plane. A reference voltage is provided and means are provided for generating a corrected reference voltage by changing the reference voltage in a direction opposite to a deviation of the control voltage from a normal operating voltage. An impulse/digital converter receives the voltage impulse and provides a digital output which is connected to a digital/analog converter which creates an analog output based upon the corrected reference voltage and the digital input.
345220
Aktiengesellschaft Siemens
Fetherstonhaugh & Co.
LandOfFree
Device for contact-free thickness or interval measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device for contact-free thickness or interval measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for contact-free thickness or interval measurement will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-736575