Device for measuring and/or representing electrical and...

G - Physics – 01 – N

Patent

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Details

G01N 27/00 (2006.01) G01N 22/00 (2006.01) G01N 22/02 (2006.01) G01N 22/04 (2006.01) G01R 33/12 (2006.01)

Patent

CA 2295520

The invention relates to a device for measuring and/or representing electrical and magnetic material properties or material properties directly derivable therefrom. The aim of the invention is to obtain better deep action measurement and to make it possible to adjust the surface geometry and sensitivity of the measurement to the samples to be examined. To this end, the resonators forming the applicator consist of electrically connected structures having two or more conductors which at least in the area of some of the voltage peaks or load centres of gravity which form during resonance are open towards the object to be measured. In addition, the conductor structures are arranged in such a way that a resulting superposition field of the load centres of gravity open towards the object to be measured can be approximated to a target field geometry at the interface to the object to be measured.

L'invention concerne un dispositif permettant de mesurer et/ou de représenter des propriétés de matériaux, d'ordre électrique, magnétique ou pouvant en être indirectement dérivées. L'invention vise à parvenir à une meilleure efficacité en profondeur de la mesure et à permettre d'adapter la géométrie superficielle et la sensibilité des mesures aux échantillons à examiner, ce, dans des plages étendues. A cet effet, les résonateurs qui forment l'applicateur se composent de structures à deux ou à plusieurs conducteurs couplés électriquement, qui sont ouvertes en direction de l'objet mesuré, du moins dans la plage de quelques maxima de tension ou de centres de gravité de charge intervenant lors de la résonance. Les structures conductrices sont disposées de manière qu'un champ de superposition de leur centres de gravité de charge ouverts en direction de l'objet à mesurer en résultant puisse, à l'interface de l'objet à mesurer, être amené à approcher une géométrie de champ ciblée.

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