G - Physics – 01 – R
Patent
G - Physics
01
R
356/117, 324/30,
G01R 31/26 (2006.01) G01R 27/02 (2006.01) G01R 27/04 (2006.01) G01R 27/26 (2006.01)
Patent
CA 2012336
A dielectric test device formed on a substrate which includes a conductive ground plane layer formed over the substrate, a dielectric layer over the ground plane layer and a short and long conductive strip overlying the dielectric layer. Each of the long and short strips extends between common input and output conductive pads and are substantially identical in all respects except for length. Measurement of the interference pattern at the output node resulting from an input signal of a single frequency applied to the input node as frequency is varied over the gigahertz range allows the calculation of effective dielectric constant, propagation velocity as a function of frequency and attenuation.
Blake Cassels & Graydon Llp
Neufeld Richard D.
Pmc-Sierra Inc.
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