Device for measuring the thickness of a layer of material

Details Device for measuring the thickness of a layer of material Device for measuring the thickness of a layer of material

G - Physics

01

B

G01B 13/06 (2006.01) D21F 1/06 (2006.01) D21F 7/06 (2006.01)

Patent

CA 2691525

A device (1; 1b) for measuring the thickness of a layer of material (20) is provided with reading means (2) and control means (3) connected to the reading means (2). The reading means (2) include a microwave planar type sensor (6) and an A/D converter (8) connected to the microwave sensor (6) and arranged in proximity of the microwave sensor (6).

L'invention porte sur un dispositif (1; 1b) de mesure de l'épaisseur d'une couche d'un matériau (20), qui comporte des moyens de lecture (2) et des moyens de commande (3) raccordés aux moyens de lecture (2). Les moyens de lecture (2) comprennent un détecteur hyperfréquence de type plan (6) et un convertisseur A/N (8) raccordé au détecteur hyperfréquence (6) et agencé à proximité du détecteur hyperfréquence (6).

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