G - Physics – 01 – B
Patent
G - Physics
01
B
358/6
G01B 15/04 (2006.01) G01B 15/02 (2006.01)
Patent
CA 1256219
ABSTRACT The invention describes apparatus for measuring the thickness profile of rolled sheet metal pieces and sheet metal bands with an X-ray tube and a movable slit diaphragm, positioned closely therebefore, with the X-rays penetrating the sheet metal to be measured and with the degree of absorption yielding a measurement of the thickness of the sheet metal. According to the invention, a very great number of measurements can be carried out very accurately because the slit diaphragm has the form of a circular ring and is rotated around the X- ray tube by a drive means and has a considerable number of slits.
484329
Antpusat Eduard
Boettcher Wolfgang
Kopineck Hermann-Josef
Hoesch Aktiengesellschaft
Macrae & Co.
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