G - Physics – 01 – N
Patent
G - Physics
01
N
324/23
G01N 27/06 (2006.01) G01N 25/00 (2006.01)
Patent
CA 1108698
ABSTRACT OF THE DISCLOSURE An ion concentration analyser having a reference chamber and a sample chamber, maintained at a substantially common temperature, separated by an ion-conductive partition. A known concentration of a reference material in the reference chamber is varied relative to the unknown concentration of a sample material in the sample chamber until the output across the ion-conductive partition reaches a set point from which the concentration of the sample material is calculated, for example as a function of the temperature of the ion-conductive partition. Maintenance of the reference chamber and the sample chamber at a substantially common temperature significantly improves the resistance of the ion concentration analyser to thermal shock.
312341
Holman Danny F.
Kocache Riad M.a.
Sunderland Ronald H.
Macrae & Co.
Sybron Corporation
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