Device for the emi testing of electronic systems

Details Device for the emi testing of electronic systems Device for the emi testing of electronic systems

H - Electricity

01

Q

324/48

H01Q 17/00 (2006.01) G01R 29/08 (2006.01) G01R 31/00 (2006.01)

Patent

CA 1273060

Abstract of the disclosure Device for the EMI testing of electronic systems The device according to the invention exhibits a TEM waveguide (1), which opens out in a pyramid shape and which is closed by a wall (7) of high-frequency peak absorbers (7.1) and which exhibits an asymmetrically dis- posed, plate-shaped inner line (6), which is connected to a plurality of terminal resistors (8.1, 8.2, 8.3) through the absorber wall (7). The TEM waveguide (1) fur- ther exhibits a closed outer line (5). The absorber wall (7) is curved in the manner of a spherical segment, the center of curvature being situated in the region of the tip (2) of the pyramid-shaped TEM waveguide (1).

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