Device management method, analysis system used for the...

G - Physics – 07 – C

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G07C 3/08 (2006.01) F16T 1/48 (2006.01)

Patent

CA 2616455

It is possible to accurately and effectively analyze use conditions and failure causes of a plenty of management object devices. All-number diagnosis is periodically performed to inspect whether each of a plenty of management object devices T is normal or defective. Upon all-number diagnosis each time, diagnosis results Ic are recorded. If any device is found to be defective, the defective device is repaired or replaced. According to diagnosis results Ic of the all-number diagnosis performed several times, analysis data G, E are created to indicate a failure occurrence frequency N for each of the management object devices T.

L'objet de l'invention est d'analyser précisément et efficacement les états d'utilisation et les causes de panne de nombreux dispositifs objet de gestion. Un diagnostic général est effectué périodiquement pour vérifier si chacun des dispositifs objet de gestion T d'une multitude est fonctionnel ou défectueux. Après chaque diagnostic général, les résultats de diagnostic Ic sont enregistrés. Si un dispositif quelconque est reconnu défectueux, celui-ci est réparé ou remplacé. En fonction des résultats de diagnostic Ic du diagnostic général réalisé plusieurs fois, les données d'analyse G, E sont créées pour indiquer une fréquence N d'occurrence de panne pour chacun des dispositifs objet de gestion T.

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