Device, system, and method of automatic assessment of...

Details Device, system, and method of automatic assessment of... Device, system, and method of automatic assessment of...

G - Physics

09

B

G09B 5/00 (2006.01)

Patent

CA 2750706

Device, system, and method of automatic assessment of pedagogic parameters. For example, a method of computer-assisted assessment includes: creating a pre-defined ontology of pedagogic concepts; creating a log of interactions of a student with one or more learning activities, wherein the learning activities are concept-tagged based on said ontology; creating a pedagogic Bayesian network based on said log of interactions and based on said ontology; and based on said pedagogic Bayesian network, estimating a pedagogic parameter related to said student.

L'invention concerne un dispositif, un système et un procédé d'évaluation automatique de paramètres pédagogiques. Par exemple, un procédé d'évaluation assistée par ordinateur consiste à : créer une ontologie prédéfinie de concepts pédagogiques ; créer un enregistrement d'interactions d'un étudiant avec une ou plusieurs activités d'apprentissage, les activités d'apprentissage étant étiquetées par concept sur la base de ladite ontologie ; créer un réseau pédagogique bayésien sur la base dudit enregistrement d'interactions et sur la base de ladite ontologie ; et, sur la base dudit réseau pédagogique bayésien, estimer un paramètre pédagogique concernant ledit étudiant.

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