Diagnostic circuit utilizing bidirectional test data...

Details Diagnostic circuit utilizing bidirectional test data... Diagnostic circuit utilizing bidirectional test data...

G - Physics

01

R

354/225.1

G01R 31/28 (2006.01) G01R 31/3185 (2006.01) G06F 11/267 (2006.01)

Patent

CA 1251569

Title of the Invention: DIAGNOSTIC CIRCUIT UTILIZING BIDIRECTIONAL TEST DATA COMPARISONS ABSTRACT OF THE DISCLOSURE Test points are connected in parallel to shift registers which are read out bidirectionally. Comparisons are then made of the data in each direction of shift and inconsistencies of the compared signals, from a reference data signal, cannot only indicate which test point has an error present thereat, but whether and which stage of a shift register employed in the present diagnostic system is inoperative.

510205

Affiliated with

Also associated with

Rating

Diagnostic circuit utilizing bidirectional test data... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Diagnostic circuit utilizing bidirectional test data..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Diagnostic circuit utilizing bidirectional test data... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1297466