G - Physics – 06 – F
Patent
G - Physics
06
F
354/46
G06F 11/22 (2006.01) G06F 11/25 (2006.01)
Patent
CA 1336206
A diagnostic expert system is set up with a first diagnostic subsystem which is based on a maintenance technician's knowledge and a second diagnostic subsystem which is based on a design engineer's knowledge. If a fault cannot be located under the first diagnostic subsystem, the second diagnostic subsystem, which operates by using of the result obtained from the first diagnostic subsystem is started so as to determine the location of the fault.
596794
Aramaki Takahiro
Fukazawa Mitsunori
Kim Moo Wan
Wakamoto Masaaki
Fujitsu Limited
Mcfadden Fincham
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