Diagnostics using information specific to a subsystem

Details Diagnostics using information specific to a subsystem Diagnostics using information specific to a subsystem

G - Physics

06

F

G06F 17/40 (2006.01) B61C 17/04 (2006.01) B61C 17/12 (2006.01) B61L 23/00 (2006.01) G05B 9/00 (2006.01) G05B 9/02 (2006.01) G05B 15/00 (2006.01) G06F 11/07 (2006.01) G06F 11/30 (2006.01)

Patent

CA 2444609

A method for analyzing fault data specific to a machine comprising a plurality of subsystems, said method comprising collecting fault data from a machine experiencing a malfunction 50, filtering said fault data with a noise- reduction filter to produce noise-reduced fault data 52, establishing fault rules specific to a subsystem of said machine 54, applying fault rules specific to said subsystem to noise- reduced fault data 56, and predicting at least one repair specific to said subsystem based on said fault rules and said noise-reduced fault data 58.

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