Diffraction limited imaging systems

Details Diffraction limited imaging systems Diffraction limited imaging systems

H - Electricity

04

N

88/94

H04N 1/00 (2006.01) G02B 21/00 (2006.01) G02B 27/58 (2006.01)

Patent

CA 1204312

ABSTRACT An imaging system for obtaining information within the diffraction limit comprises an illuminating source of radiation, e.g. a laser. A lens system focusses radiation from a small area of an object onto a detector array in an image plane. The detectors measure the amplitude of the received radiation giving a matrix of information. This matrix is then inverted by a computer to reconstruct the image for observation on a cathode ray tube. The object is scanned by scanning the radiation or stepping the object.

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