Digital tester local memory data storage system

Details Digital tester local memory data storage system Digital tester local memory data storage system

G - Physics

01

R

356/24, 324/58.2

G01R 31/28 (2006.01) G01R 31/319 (2006.01)

Patent

CA 1191552

-18- ABSTRACT OF THE DISCLOSURE In a digital tester for evaluating electronic components, a local memory unit for each data channel in the tester is loaded with test vector information only in the locations of the memory relating to transitions that take place in the operation of the data channel. In addition, a transition bit is stored in each memory location to signify whether the vector information in that location represents valid transi- tion data. The transition bit is used to control the reading of information from the memory into a register that controls the flow of information in the data channel, so that only the valid transition vectors are fed into data channel control circuitry. This pro- cedure substantially reduces the amount of data that must be loaded into the memory, and hence reduces the total time necessary to thoroughly test a circuit.

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