G - Physics – 03 – C
Patent
G - Physics
03
C
149/10, 96/219
G03C 5/00 (2006.01) G03F 7/42 (2006.01)
Patent
CA 1067332
Abstract of the Disclosure Baked novolak resin based positive photoresists are either developed after exposure or stripped, following the use of the pattern resist layer as an etch mask, in aqueous solutions of a combination of permanganate and phosphoric acid.
236873
Paal Gabor
Wustenhagen Jurgen F.
International Business Machines Corporation
Na
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