Distance measuring device, distance measuring method and...

G - Physics – 01 – S

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G01S 13/36 (2006.01) G01S 7/35 (2006.01)

Patent

CA 2551321

A transmission unit (20) emits an electromagnetic wave having the same frequency f as an output signal from a sending unit (12) in a direction of a measurement axis (x-axis). A detecting unit (30) performs synchronous detection on a reflected wave (R) detected by a directional coupler (32) by an in-phase signal and a quadrature signal of the transmission signal, and by extracting DC component from the detection signal, detects the in-phase component (I(f)) and quadrature component (Q(f))of the reflected wave (R). An analysis signal generating unit (42) mixes the in-phase component (I(f)) and quadrature component (Q(f)) of the reflected wave (R) and signals (I0(f), Q0(f)), having periodicity corresponding to a prescribed distance (d0), and using only one of the resulting side bands, generates an analysis signal (p(f)). Fourier transform unit (44) finds distance to the object of measurement from a profile (P(x)) obtained by Fourier transform of the analysis signal (p(f)).

Un transmetteur (20) émet une onde électromagnétique sur la même fréquence que celle d'un signal de sortie d'un émetteur (12) dans une direction de mesure axiale (axe x). Un détecteur (30) effectue la détection synchrone sur une onde réfléchie (R), détectée par un coupleur directif (32) au moyen d'un signal en phase et d'un signal en quadrature du signal de transmission et, en extrayant la composante continue du signal de détection, détectant la composante en phase (I(f)) et la composante en quadrature (Q(f)) de l'onde réféchie (R). Un détecteur d'écart d'analyse (42) mélange la composante en phase (I(f)) et la composante en quadrature (Q(f)) de l'onde réfléchie (R) et des signaux (I0(f), Q0(f)), en faisant correspondre la périodicité à une distance prescrite (d0) et en n'ayant recours qu'à une seule bande latérale, et génère ainsi un signal d'analyse (p(f)). Un transformateur de Fourier (44) détermine la distance de l'objet de mesure à partir d'un profil (P(x)) obtenu par la transformée de Fourier du signal d'analyse (p(f)).

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