Drop weight type impact testing machine

Details Drop weight type impact testing machine Drop weight type impact testing machine

G - Physics

01

M

G01M 7/08 (2006.01) G01N 3/30 (2006.01) G01N 3/00 (2006.01)

Patent

CA 2182125

An impact testing apparatus includes a main frame mounted on a main frame base. There is a pair of spaced-apart guide columns with an impact hammer slidably mounted thereon. A lifting beam is slidably mounted on the guide columns above the impact hammer and can be raised by a hoist to the top of the main frame. There is a specimen base adjacent the main frame base. There is a movable joint between the specimen base and the main frame base, whereby the main frame base is isolated from shock resulting from impact of the hammer on the specimen base. Preferably the joint is occupied by a non-rigid member, such as an elastomeric member. Preferably there is adjustable means for tensioning the guide columns. There may be an electromagnetic latch between the lifting beam and the impact hammer.

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