Dual-pin probe for testing circuit boards

Details Dual-pin probe for testing circuit boards Dual-pin probe for testing circuit boards

G - Physics

01

R

G01R 1/073 (2006.01)

Patent

CA 2357012

A dual-pin probe (100) has a probe body (104), a probe head (102), a signal pin (120), and a ground pin (122). The probe body couples to a robotic system configured to manipulate the dual-pin probe relative to a circuit board under test. The probe body is coupled to the probe head. The signal pin and the ground pin extend from a face of the probe head and are substantially parallel to one another. The ground pin is at a variable distance from the signal pin. The robotic system varies the distance between the ground pin and the signal pin, and positions the ground pin and the signal pin to contact nodes on the circuit board to automate the test.

Cette invention concerne une sonde à double broche (100) comportant un corps de sonde (104), une tête de sonde (102), une broche signal (120), et une broche de masse (122). Le corps de sonde est couplé à un système robotique conçu pour manipuler la sonde double broche par rapport à une carte de circuit imprimé en cours de contrôle. Le corps de sonde est relié à la tête de sonde. La broche signal et la broche de masse dépassent d'un bord de la tête de sonde et sont sensiblement parallèles l'une par rapport à l'autre. L'écartement entre la broche de masse et la broche signal est variable. Le système robotique fait varier cet écartement et positionne la broche de terre et la broche signal par rapport à des noeuds de contactn vue d'un contrôle automatique de la carte de circuit imprimé.

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