G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 3/36 (2006.01) G01N 3/10 (2006.01) G01N 3/18 (2006.01) G01N 3/02 (2006.01)
Patent
CA 2105173
Apparatus, and an accompanying method for use therein for a dynamic material testing system (500), and particularly for one that tests a specimen (570) by compressively deforming its work zone and that has independent control over specimen defor- mation (strain) and strain rate. The apparatus can also simultaneously direct resistance heat or conductively cool the specimen under controlled conditions, in order to establish isothermal planes at a desired substantially uniform temperature throughout the specimen work zone before, during and after each compressive deformation thereof.
Dynamic Systems Inc.
Fasken Martineau Dumoulin Llp
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