G - Physics – 01 – N
Patent
G - Physics
01
N
324/50
G01N 27/90 (2006.01)
Patent
CA 2040766
ABSTRACT OF THE DISCLOSURE An eddy current imaging system (15) includes an eddy current sensing coil (17) positioned proximate a workpiece for scanning the workpiece to produce a signal (21, 22) indicative of the integrity of the workpiece for regions in an x, y array of data. Such a signal (21, 22) may be a complex impedance signal representative of the amplitude and/or the phase of the signal. Two data processing techniques are disclosed for enhancing the display of a flaw in the workpiece. The first includes the step (30) of calculating a spatial derivative of the amplitude and/or phase indicative signal from the coil (17) and providing an image of the spatial derivative to produce a C scan of the spatial derivative. The second includes the steps (35, 36) of determining the regions of maximum ascent and/or descent of the signal for regions in the scan and calculating an impedance plane trajectory from the data array of path points for displaying a reconstructed optimum signal independent of path pattern.
Lareau John P.
Leonard David S.
Abb Amdata Inc.
Lareau John P.
Leonard David S.
Smart & Biggar
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