Electrical circuit test probe

Details Electrical circuit test probe Electrical circuit test probe

G - Physics

01

R

324/74.2

G01R 1/067 (2006.01)

Patent

CA 1309464

ELECTRICAL CIRCUIT TEST PROBE Abstract of the Disclosure: A probe for providing electrical contact to electrical circuits during the testing thereof. There is a tubular housing having an open end and a generally closed end with a main portion extending from the generally closed end towards the open end and a retaining and sliding bearing portion adjacent the open end having a diameter smaller than the main portion. A probe plunger is disposed in the tubular housing and has a cylindrical inner portion which is a slide fit and disposed within the main portion of the tubular housing and a cylindrical outer portion of a diameter smaller than the inner portion and forming a shoulder with the inner portion at a point of meeting. The outer portion of the plunger passes through the retaining and sliding bearing portion and has an outside diameter which is a slide fit to the inside diameter of the retaining and sliding bearing portion. A longitudinally compressible bias spring is disposed between the generally closed end of the tubular housing and the inner portion of the probe plunger under a pre-loading for biasing the probe plunger towards an extended position.

609738

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