Electrical connectors and ic chip tester embodying same

Details Electrical connectors and ic chip tester embodying same Electrical connectors and ic chip tester embodying same

H - Electricity

01

R

324/58.1, 339/11

H01R 33/76 (2006.01) G01R 1/04 (2006.01) G01R 1/073 (2006.01) G01R 31/26 (2006.01) G01R 31/28 (2006.01) H01L 23/32 (2006.01) H01R 11/09 (2006.01) H01R 13/33 (2006.01) H01R 13/642 (2006.01)

Patent

CA 1320546

ABSTRACT OF THE DISCLOSURE A novel wadded wire-plunger contact is provided which possesses excellent durability and desired func- tional characteristics in a large variety of applications such as the testing of IC chips.

615035

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