G - Physics – 01 – B
Patent
G - Physics
01
B
26/124, 324/45
G01B 7/00 (2006.01) B23Q 15/00 (2006.01) B23Q 17/20 (2006.01) G01B 7/06 (2006.01) G11B 5/187 (2006.01) G11B 5/31 (2006.01)
Patent
CA 1311272
Abstract Method and apparatus for determining present machining height during machining of a workpiece includes an analog resistive sensor, a discrete resistive sensor and a resistive integrity sensor. Analog sensor preferably has a plurality of resistive elements. Discrete sensor includes contact break points on resistive legs, each leg having a different resistive value to create a step-wise incremental change in resistance of discrete sensor as contacts are lapped away. Integrity sensor has resistive value in fixed relation to resistive value of discrete sensor such that ratio is indicative of integrity before machining. Invention enables use of electronic lapping guide with electrically conductive lap without shorting out. Discrete sensor value used to determine location of rear plane of analog sensor and analog sensor value used to confirm identity of break point as part of method for determining current lapping height. Formulae disclosed enable computation of lapping height from measured resistances based on a known height of the analog sensor prior to lapping.
605966
Digital Equipment Corporation
Quantum Corporation
Smart & Biggar
Smith Alan B.
LandOfFree
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